Testability evaluation for analog linear circuits via transfer function analysis

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn , Issue , 2005, Pages 992-995

  Cannas, Barbara ^a   Fanni, Alessandra ^a   Montisci, Augusto ^a  

^a UNIVERSITY OF CAGLIARI   (Italy)

Author keywords

Ambiguity groups determination.; Linear circuit fault diagnosis; Testability analysis

Indexed keywords

AMBIGUITY GROUPS DETERMINATION.; FAULT EQUATION; LINEAR CIRCUIT FAULT DIAGNOSIS; LINEAR CIRCUITS; NEW APPROACHES; TESTABILITY ANALYSIS; TESTABILITY EVALUATION; TESTABILITY MEASURES; TRANSFER FUNCTION ANALYSIS;

ANALOG CIRCUITS; COMPUTATIONAL COMPLEXITY;

ELECTRIC NETWORK ANALYSIS;

EID: 42949102090     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISCAS.2005.1464757     Document Type: Conference Paper

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