How to test brain and brain simulant at ballistic and blast strain rates

Biomedical Sciences Instrumentation

Volumn 44, Issue , 2008, Pages 129-134

  Zhang, Jiangyue ^a   Song, Bo ^b   Pintar, Frank A ^a   Yoganandan, Narayan ^a   Chen, Weinong ^b   Gennarelli, Thomas A ^a  

^a CLEMENT J ZABLOCKI VETERANS AFFAIRS MEDICAL CENTER   (United States)

^b PURDUE UNIVERSITY   (United States)

Author keywords

Ballistic; Blast; Brain; Brain simulant; High strain rate; Material testing; Strain rate sensitivity; Stress strain relation

Indexed keywords

MATERIALS TESTING; MECHANICAL PROPERTIES; MEDICAL PROBLEMS; STRAIN RATE; STRESS-STRAIN CURVES;

BRAIN SIMULANTS; STRAIN RATE SENSITIVITY; STRESS STRAIN RELATION;

NEUROLOGY;

ALUMINUM; SILICON;

BRAIN; BRAIN TISSUE; CONFERENCE PAPER; EXPERIMENTAL MODEL; EXPLOSION; GEL; GUNSHOT INJURY; INTRACRANIAL PRESSURE; LOW IMPEDANCE ALUMINUM BAR; MATERIALS TESTING; MATHEMATICAL MODEL; PULSE SHAPING METHOD; SEMICONDUCTOR; SIMULATION; SOFT TISSUE; SPLIT HOPKINSON BAR METHOD; STRAIN GAUGE TRANSDUCER; STRESS STRAIN RELATIONSHIP; TECHNIQUE; TRAUMATIC BRAIN INJURY;

EID: 42949084610     PISSN: 00678856     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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