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In general, the linewidth is influenced both by intrinsic dephasing processes of the coherent IS polarization and by imperfections of the actual sample like alloy disorder, well width fluctuations, and interface roughness. Because of the high perfection of the growth techniques used, especially molecular-beam epitaxy, today's high-quality samples have only very small structural inhomogeneities with a negligible influence on the linewidth. Since the theoretical results are compared with experiments on such high-quality samples, we do not include scattering due to interface roughness and impurities here. For the sample used in the experiment (sample A), time-resolved four-wave mixing measurements [R.A. Kaindl, K. Reimann, M. Woerner, T. Elsaesser, R. Hey, and K. H. Ploog, Phys. Rev. B 63, 161308 (2001)] have shown that inhomogeneous broadening has a negligible influence.
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