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Volumn 70, Issue 5, 2004, Pages

Experimental determination of the number of flux lines trapped by microholes in superconducting samples

Author keywords

[No Author keywords available]

Indexed keywords

LEAD;

EID: 42749100421     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.70.054515     Document Type: Article
Times cited : (35)

References (36)
  • 7
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    • M. Baert, V. V. Metlushko, R. Jonckheere, V. V. Moshchalkov, and Y. Bruynseraede, Phys. Rev. Lett. 74, 3269 (1995); V. V. Moshchalkov, V. Bruyndoncx, L. Van Look, M. J. Van Bael, Y. Bruynseraede, and A. Tonomura, Handbook of Nanostructured Materials and Nanotechnology, edited by H. S. Nalwa, Vol. 3: Electrical Properties (Academic, San Diego, 2000).
    • (1995) Phys. Rev. Lett. , vol.74 , pp. 3269
    • Baert, M.1    Metlushko, V.V.2    Jonckheere, R.3    Moshchalkov, V.V.4    Bruynseraede, Y.5
  • 10
    • 7444258632 scopus 로고
    • D. R. Nelson and V. M. Vinokur, Phys. Rev. Lett. 68, 2398 (1992); Phys. Rev. B 48, 13 060 (1993).
    • (1993) Phys. Rev. B , vol.48 , pp. 13060
  • 25
    • 33646635743 scopus 로고    scopus 로고
    • note
    • c≥0.97. In the used samples we found that for t<0.97 matching effects progressively fade out.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.