메뉴 건너뛰기




Volumn 457, Issue 1-2, 2008, Pages 372-375

A new ternary nitride La2GaN3: Synthesis and crystal structure

Author keywords

Crystal and structure symmetry; Crystal growth; Nitride materials; X ray diffraction

Indexed keywords

CRYSTAL GROWTH; CRYSTAL STRUCTURE; NEGATIVE IONS; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION;

EID: 42649141243     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2007.02.110     Document Type: Article
Times cited : (15)

References (24)
  • 10
    • 42649116614 scopus 로고    scopus 로고
    • Brucker, XPREP, Version 6.14, Brucker Analytical X-ray System, Madison, WI, 2003.
    • Brucker, XPREP, Version 6.14, Brucker Analytical X-ray System, Madison, WI, 2003.
  • 24
    • 42649144945 scopus 로고    scopus 로고
    • F. Cheviré, C. Ranjan, F. J. DiSalvo, to be published.
    • F. Cheviré, C. Ranjan, F. J. DiSalvo, to be published.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.