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Volumn 52, Issue 4, 1996, Pages 760-761

Ba3Ga2N4

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; CRYSTAL ATOMIC STRUCTURE; NITRIDES;

EID: 0030124692     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270195015915     Document Type: Article
Times cited : (49)

References (16)
  • 9
    • 84889227342 scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
    • Sheldrick, G. M. (1990). SHELXTL/PC User's Manual. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • (1990) SHELXTL/PC User's Manual
    • Sheldrick, G.M.1
  • 11
    • 0003428070 scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
    • Siemens (1989). XEMP. Empirical Absorption Correction Program. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • (1989) XEMP. Empirical Absorption Correction Program
  • 12
    • 0003409324 scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
    • Siemens (1991). XSCANS User's Manual. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • (1991) XSCANS User's Manual


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.