Investigation of grain boundaries influence on dielectric properties in fine-grained BaTiO3 ceramics without the core-shell structure

Ceramics International

Volumn 34, Issue 4, 2008, Pages 933-937

  Wada, Nobuyuki ^a   Hiramatsu, Takashi ^a   Tamura, Toshiyuki ^a   Sakabe, Yukio ^a  

^a MURATA MANUFACTURING CO LTD   (Japan)

Author keywords

B. Grain boundaries; C. Dielectric properties; D. BaTiO3; E. Capacitors

Indexed keywords

CAPACITORS; CERAMIC MATERIALS; DIELECTRIC PROPERTIES; ETCHING; GRAIN BOUNDARIES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; RESIDUAL STRESSES; X RAY DIFFRACTION ANALYSIS;

CHEMICAL ETCHING ANALYSES; DOPED ELEMENTS; IMPEDANCE SPECTROSCOPY; MULTILAYER CERAMIC CAPACITORS (MLCS);

BARIUM COMPOUNDS;

EID: 42649140880     PISSN: 02728842     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ceramint.2007.09.061     Document Type: Article

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