Fabrication and optimization of single-junction nc-Si:H n-i-p solar cells using Si:H phase diagram concepts developed by real time spectroscopic ellipsometry

Journal of Non-Crystalline Solids

Volumn 354, Issue 19-25, 2008, Pages 2397-2402

  Cao, Xinmin ^a,b   Stoke, Jason A ^a   Li, Jian ^a   Podraza, Nikolas J ^a   Du, Wenhui ^a   Yang, Xiesen ^a   Attygalle, Dinesh ^a   Liao, Xianbo ^a   Collins, Robert W ^a   Deng, Xunming ^a,b  

^a UNIVERSITY OF TOLEDO   (United States)

^b Xunlight Corporation   (United States)

Author keywords

Ellipsometry; Photovoltaics; Silicon; Solar cells

Indexed keywords

DEPOSITION; ELLIPSOMETRY; PHASE DIAGRAMS; PHOTOVOLTAIC CELLS; SILICON;

DEPOSITION PHASE DIAGRAMS; ROTATING-COMPENSATOR MULTICHANNEL ELLIPSOMETER; TRANSITION BOUNDARIES;

SOLAR CELLS;

EID: 42649090433     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2007.10.078     Document Type: Article

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