Nanostructure of pure iron anodically oxidized in borate buffer solution and annealed by infrared radiation

Journal of Nanoscience and Nanotechnology

Volumn 8, Issue 2, 2008, Pages 493-502

  Nanjo, Hiroshi ^a   Fujimura, Motoaki ^b   Xia, Zhengbin ^a   Ishikawa, Ikuo ^a   Kanakubo, Mitsuhiro ^a   Aizawa, Takafumi ^a   Izumisawa, Miki ^c   Onagawa, Jun ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b TOHOKU GAKUIN UNIVERSITY   (Japan)

^c Sundai Preparatory School   (Japan)

Author keywords

Anneal; Anodic oxidation; Atomically flat; Infrared radiation; Nanostructure; Terrace

Indexed keywords

ATOMIC SCALE FLATNESS; BORATE BUFFER SOLUTION; ELLIPSOMETRIC PARAMETERS; IR ANNEALING;

ANNEALING; ANODIC OXIDATION; ELLIPSOMETRY; GRAIN GROWTH; INFRARED RADIATION; PASSIVATION;

NANOSTRUCTURES;

EID: 42549161988     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2008.D131     Document Type: Conference Paper

References (23)

1. G. Binning, H. Rohrer, Ch. Gerber, and E. Weibel, Phys. Rev. Lett. 49, 57 (1982).
2. V. Maurice, H. Talah, and P. Marcus, Surf. Sci. 304, 98 (1994).
3. S.-L. Yau, F.-R. F. Fan, T. P. Moffat, and A. J. Bard, J. Phys. Chem. 98, 5493 (1994).
4. V. Maurice, W. P. Yang, and P. Marcus, J. Electrochem. Soc. 141, 3016 (1994).
5. N. Ikemiya, T. Kubo, and S. Hará, Surf. Sci. 323, 81 (1995).
6. M. P. Ryan, R. C. Newman, and G. E. Thompson, Philos. Mag. B 70, 241 (1994).
7. M. P. Ryan, R. C. Newman, and G. E. Thompson, J. Electrochem. Soc. 141, L164 (1994).
8. M. P. Ryan, R. C. Newman, and G. E. Thompson, J. Electrochem. Soc. 142, L177 (1995).
9. H. Nanjo, R. C. Newman, and N. Sanada, Appl. Surf. Sci. 121/122, 253 (1997).
10. H. H. Deng, P. Qian, A. Santosa, N. Sanada, M. Yoneya, and H. Nanjo, Proc. 3rd Int. Sym. on Atomic Level Characterizations for New Materials and Devices '01, Nara (2001), p. 403.
11. H. H. Deng, P. Qian, N. Sanada, M. Yoneya, and H. Nanjo, J. Electrochem. Soc. 150, B336 (2003).
12. H. Nanjo, H. H. Deng, I. S. Oconer, I. Ishikawa, and T. M. Suzuki, Jpn. J. Appl. Phys. 44B, 539 (2005).
13. L. M. Long and N. A. Lockington, Corros. Sci. 7, 447 (1967).
14. H. R. Wesson, J. R. Welker, and C. M. Sliepcevich, Combust. Flame 16, 303 (1971).
15. C. Russo, Nucl. Instrum. Meth. B 6, 298 (1985).
16. D. Aitken, S. Mehta, N. Parisi, C. J. Russo, and V. Schwartz, Nucl. Instrum. Meth. B 21, 622 (1987).
17. S. Szymura and H. Bala, Mater. Chem. Phys. 21, 367 (1989).
18. G. Zotti, G. Schiavon, S. Zecchin, and U. Casellato, J. Electrochem. Soc. 145, 385 (1998).
19. H. Kim, N. Hara, and K. Sugimoto, J. Electrochem. Soc. 146, 3679 (1999).
20. V. A. Alves and C. M. A. Brett, Electrochim. Acta 47, 2081 (2002).
21. T. Ohtsuka and A. Ohta, Mater. Sci. and Eng. A 198, 169 (1995).
22. I. J. Kim, H. Nanjo, T. Iijima, and T. Abe, Jpn. J. Appl. Phys. 39, 568 (2000).
23. H. Nanjo, Y. Yao, Z. Xia, M. Nishioka, Y. Hiejima, and M. Kanakubo, e-J. Surf. Sci. Nanotech. 3, 345 (2005).