메뉴 건너뛰기




Volumn 1, Issue , 2006, Pages 421-427

Electroless Ni-W-P alloys as barrier coatings for liquid solder interconnects

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROLESS PLATING; ELECTRONICS PACKAGING; METALLIZING; PROTECTIVE COATINGS; REACTION RATES; SOLDERING ALLOYS;

EID: 42549096457     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESTC.2006.280037     Document Type: Conference Paper
Times cited : (15)

References (9)
  • 1
  • 3
    • 7244231051 scopus 로고    scopus 로고
    • Materials and processes for implementing high-temperature liquid interconnects
    • Mannan, S.H., Clode, M.P., "Materials and processes for implementing high-temperature liquid interconnects," IEEE Trans. On Adv. Packaging, Vol. 27, No. 3 (2004), pp. 508-514
    • (2004) IEEE Trans. On Adv. Packaging , vol.27 , Issue.3 , pp. 508-514
    • Mannan, S.H.1    Clode, M.P.2
  • 4
    • 0001215211 scopus 로고
    • Electroless Deposition of Nickel Alloys
    • Pearlstein, F., Weightman, R.F., "Electroless Deposition of Nickel Alloys," Electrochem. Technol., Vol. 6, No. 11-12 (1968), pp. 427-430.
    • (1968) Electrochem. Technol , vol.6 , Issue.11-12 , pp. 427-430
    • Pearlstein, F.1    Weightman, R.F.2
  • 7
    • 0003137272 scopus 로고
    • Electrical Resistance of Electroless Nickel-Tungsten-Phosphorus Alloy Deposits
    • Aoki, K. and Takano, O., "Electrical Resistance of Electroless Nickel-Tungsten-Phosphorus Alloy Deposits", Plat. Surf. Finish., Vol. 77, No. 3 (1990), pp. 48-52.
    • (1990) Plat. Surf. Finish , vol.77 , Issue.3 , pp. 48-52
    • Aoki, K.1    Takano, O.2
  • 8
    • 0032614004 scopus 로고    scopus 로고
    • Solder reaction-assisted crystallistion of electroless Ni-P under bump metallization in low cost flip chip technology
    • Jang, J.W., Kim, P.G., Tu, K.N., Frear, D.R., Thompson, P., "Solder reaction-assisted crystallistion of electroless Ni-P under bump metallization in low cost flip chip technology," J. Appl. Phys., Vol. 85, No. 12 (1999), pp. 8456-8463.
    • (1999) J. Appl. Phys , vol.85 , Issue.12 , pp. 8456-8463
    • Jang, J.W.1    Kim, P.G.2    Tu, K.N.3    Frear, D.R.4    Thompson, P.5
  • 9
    • 0000757389 scopus 로고    scopus 로고
    • Morphology of interfacial reaction between lead-free solders and electroless Ni-P under bump metallization
    • Jang, J.W., Frear, D.R., Lee, T.Y., Tu, K.N., "Morphology of interfacial reaction between lead-free solders and electroless Ni-P under bump metallization," J. Appl. Phys., Vol. 88, No. 11 (2000), pp.6359-6363.
    • (2000) J. Appl. Phys , vol.88 , Issue.11 , pp. 6359-6363
    • Jang, J.W.1    Frear, D.R.2    Lee, T.Y.3    Tu, K.N.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.