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Volumn 81, Issue 9, 2005, Pages 963-988
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Degradation of interfacial chemistry of epoxy/silane/aluminium interfaces as a result of aqueous attack
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Author keywords
Adhesive; Aluminium; Aqueous attack; Organosilane; Time of flight secondary ion mass spectrometry; X ray photoelectron spectroscopy
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Indexed keywords
ADHESIVES;
ALUMINUM;
DEGRADATION;
EPOXY RESINS;
HYDRATION;
INTERFACES (MATERIALS);
SECONDARY ION MASS SPECTROMETRY;
SILANES;
SOLUTIONS;
SUBSTRATES;
THERMAL EFFECTS;
X RAY PHOTOELECTRON SPECTROSCOPY;
AQUEOUS ATTACK;
ORGANOSILANE;
TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY;
SURFACE CHEMISTRY;
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EID: 25444510636
PISSN: 00218464
EISSN: None
Source Type: Journal
DOI: 10.1080/00218460500222884 Document Type: Article |
Times cited : (10)
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References (15)
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