Conservation of polymers: A view to the future

Surface and Interface Analysis

Volumn 40, Issue 3-4, 2008, Pages 445-449

  Abel, Marie Laure ^a   Coppitters, Camille ^a,b  

^a UNIVERSITY OF SURREY   (United Kingdom)

^b INSA   (France)

Author keywords

Cultural heritage; Degradation; Polystyrene; ToF SIMS; XPS

Indexed keywords

BRITTLE FRACTURE; CONSERVATION; DEGRADATION; DISCOLORATION; MORPHOLOGY; POLYSTYRENES; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; X RAY PHOTOELECTRON SPECTROSCOPY;

CULTURAL HERITAGE; POLYMERIC CONSERVATION; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY (TOF-SIMS);

POLYMERS;

EID: 42449127879     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2746     Document Type: Conference Paper

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