TOF-SIMS analysis of corroding museum glass

Applied Surface Science

Volumn 252, Issue 19, 2006, Pages 7136-7139

  Fearn, S ^a   McPhail, D S ^a   Hagenhoff, B ^b   Tallarek, E ^b  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b TASCON GMBH   (Germany)

Author keywords

Corrosion; Glass; Museums; TOF SIMS

Indexed keywords

CORROSION; IMAGING TECHNIQUES; MUSEUMS; SECONDARY ION MASS SPECTROMETRY; SURFACE ACTIVE AGENTS; SURFACE TREATMENT;

CORROSION PRODUCTS; DETERIORATION PROCESS; GLASS SURFACE; TOF-SIMS;

GLASS;

EID: 33747170608     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.02.157     Document Type: Article

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