Oxidation processes for Si(111)-7 × 7 surfaces analyzed in situ by synchrotron-radiation-induced photoemission and medium energy ion scattering

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 467-468, Issue PART II, 2001, Pages 1237-1240

  Nishimura, T ^a   Hoshino, Y ^a   Namba, H ^a   Kido, Y ^a  

^a RITSUMEIKAN UNIVERSITY   (Japan)

Author keywords

Medium energy ion scattering; Oxidation; Photoelectron spectroscopy; Si(111) 7 7

Indexed keywords

EID: 4244210146     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)00631-3     Document Type: Article

References (10)

1. Y. Kido, H. Namba, T. Nishimura, A. Ikeda, Y. Yan, A. Yagishita, Nucl. Instr. and Meth. B136-138 (1998) 798.
2. H. Namba, M. Obara, D. Kawakami, T. Nishimura, Y. Yan, A. Yagishita, Y. Kido, J. Synchrotron Rad. 5 (1998) 557.
3. H. Iwai, H. Namba, Y. Kido, M. Taguchi, R. Oiwa, J. Synchrotron Rad. 5 (1998) 1020.
4. T. Nishimura, A. Ikeda, Y. Kido, Rev. Sci. Instr. 69 (1998) 1671.
5. C.J. Karlsson, E. Landemark, Y.-C. Chao, R.I.G. Uhrberg, Phys. Rev. B 50 (1994) 5767.
6. M.T. Sieger, D.A. Luh, T. Miller, T.-C. Chiang, Phys. Rev. Lett. 77 (1996) 2758.
7. F.J. Himpsel, F.R. Mcfeely, A. Taleb-Ibrahimi, J.A. Yarmoff, Phys. Rev. B 38 (1988) 6084.
8. K. Takayanagi, Y. Tanishiro, M. Takahashi, S. Takahashi, J. Vac. Sci. Technol. A 3 (1985) 1502.
9. K. Sakamoto, S. Doi, Y. Ushimi, K. Ohno, H. Woong, T. Ohta, Phys. Rev. B 60 (1999) R8465.
10. S-H. Lee, M.-H. Kang, Phys. Rev. Lett. 84 (2000) 1724.