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Volumn 66, Issue SUPPL. 1, 1998, Pages
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Morphology of Ag(100) thin films on Fe/GaAs(100) substrates: The influence of filmthickness and annealing processes studied by scanning tunneling microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
AG(100);
ANNEALING PROCEDURES;
ANNEALING PROCESS;
AS-GROWN FILMS;
BEFORE AND AFTER;
FILM MORPHOLOGY;
IN-BETWEEN;
ROOM TEMPERATURE DEPOSITION;
SCANNING TUNNELING MICROSCOPY (STM);
STRUCTURAL DEFECT;
AGGLOMERATION;
ANNEALING;
DEPOSITION;
EPITAXIAL FILMS;
MORPHOLOGY;
SCANNING TUNNELING MICROSCOPY;
SCREW DISLOCATIONS;
SUBSTRATES;
SURFACE ROUGHNESS;
WIND TUNNELS;
SILVER;
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EID: 4244189366
PISSN: 09478396
EISSN: 14320630
Source Type: Journal
DOI: 10.1007/s003390051312 Document Type: Article |
Times cited : (5)
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References (15)
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