Influence of layer interface parameters on dielectric characteristics of BSTO ferroelectric film planar capacitors

Journal De Physique. IV : JP

Volumn 8, Issue 9, 1998, Pages

  Dedyk, A I ^a   Karmanenko, S F ^a   Leppavuori, S ^b   Sakharov, V I ^c   Semenov, A A ^a   Serenkov, I T ^c   Ter Martirosyan, L T ^a   Uusimaki, A ^b   Wang, F ^b  

^a SAINT PETERSBURG ELECTROTECHNICAL UNIVERSITY LETI   (Russian Federation)

^b UNIVERSITY OF OULU   (Finland)

^c IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4243963776     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (8)

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2. Sengupta L.C., Sengupta S., Ferroelectricity Newsletters 4 (1996) 1- 4.
3. Vendik O.G., Ter-Martirogyan L.T., Dedyk A.I., Karmanenko S.F. Ferroelectrics 144 (1993) 33.
4. Hutther D., Meyer O., Reiner J., Linker G., Appl. Phys. Lett. 66 (1995) 1273.
5. Karmanenko S.F., Davydov V.Ju., Kozyrev A.B., Serenkov I.T, Supercond Sci. Technol. 6 (1993) 23.
6. Wang F., Uusimäki A., Leppävuori S., Physica sripta 69 (1997) 332-335.
7. Dedyk A.I., Karmanenko S.F., Ter-Martirosyan L.T., Phys.Solid State 37 (1995) 1906.
8. Shkuratov S.I, Mesjatz V.G., Jumagudin Ju.M., Sverkhprovodimost 6 (1990) 1214.