Impurity states in semiconductors calculated via tight binding: a parameter sensitivity study

Physical Review B - Condensed Matter and Materials Physics

Volumn 59, Issue 12, 1999, Pages 8137-8143

  Boykin, TimothyB ^b  

^a FEDERAL UNIVERSITY OF RIO DE JANEIRO   (Brazil)

^b UNIVERSITY OF ALABAMA IN HUNTSVILLE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4243812055     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.8137     Document Type: Article

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