Multiple andreev reflections and enhanced shot noise in diffusive superconducting-normal-superconductor junctions

Physical Review Letters

Volumn 83, Issue 10, 1999, Pages 2050-2053

  Bezuglyi, E V ^a,b   Bratus, E N ^a,b   Shumeiko, V S ^b   Wendin, G ^b  

^a B VERKIN INSTITUTE FOR LOW TEMPERATURE PHYSICS AND ENGINEERING   (Ukraine)

^b CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSFER; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTANCE; ELECTROMAGNETIC WAVE REFLECTION; ELECTROMAGNETIC WAVE SCATTERING; ENERGY GAP; HEATING; SHOT NOISE; TUNNEL JUNCTIONS;

DIFFUSIVE SEMICONDUCTOR-NORMAL-SEMICONDUCTOR (SNS) JUNCTIONS; JOHNSON-NYQUIST NOISE; MULTIPLE ANDREEV REFLECTION; OHM'S LAW;

JOSEPHSON JUNCTION DEVICES;

EID: 4243811628     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.83.2050     Document Type: Article

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