-
1
-
-
51149219862
-
-
L. Gråbæk, J. Bohr, H. H. Andersen, A. Johansen, E. Johnson, L. Sarholt-Kristensen, and I. K. Robinson, Phys. Rev. B, 45, 2628 (1992).
-
(1992)
Phys. Rev. B
, vol.45
, pp. 2628
-
-
Gråbæk, L.1
Bohr, J.2
Andersen, H.H.3
Johansen, A.4
Johnson, E.5
Sarholt-Kristensen, L.6
Robinson, I.K.7
-
2
-
-
0001042380
-
-
R. W. Cahn, P. Haasen, and E. J. Kramer (VCH, Weinheim
-
W. Schröter, M. Seibt, and D. Gilles, in Materials Science and Technology, edited by R. W. Cahn, P. Haasen, and E. J. Kramer (VCH, Weinheim, 1991). Vol. 4, p. 539.
-
(1991)
Materials Science and Technology
, vol.4
, pp. 539
-
-
Schröter, W.1
Seibt, M.2
Gilles, D.3
-
4
-
-
21544446903
-
-
A. Borghesi, B. Pivac, A. Sassella, and A. Stella, J. Appl. Phys., 77, 4169 (1995).
-
(1995)
J. Appl. Phys.
, vol.77
, pp. 4169
-
-
Borghesi, A.1
Pivac, B.2
Sassella, A.3
Stella, A.4
-
5
-
-
0012586282
-
-
S. Y. Shiryaev, J. Lundsgaard Hansen, P. Kringhøj, and A. Nylandsted Larsen, Appl. Phys. Lett., 67, 2287 (1995).
-
(1995)
Appl. Phys. Lett.
, vol.67
, pp. 2287
-
-
Shiryaev, S.Y.1
Lundsgaard Hansen, J.2
Kringhøj, P.3
Nylandsted Larsen, A.4
-
6
-
-
0342774110
-
-
M. F. Fyhn, J. Lundsgaard Hansen, J. Chevallier, and A. Nylandsted Larsen, Appl. Phys. A: Mater. Sci. Process., 68, 259 (1999).
-
(1999)
Appl. Phys. A: Mater. Sci. Process.
, vol.68
, pp. 259
-
-
Fyhn, M.F.1
Lundsgaard Hansen, J.2
Chevallier, J.3
Nylandsted Larsen, A.4
-
8
-
-
0040836932
-
-
F. J. Guarin, S. S. Iyer, A. R. Powell, and B. A. Ek, Appl. Phys. Lett., 68, 3608 (1996).
-
(1996)
Appl. Phys. Lett.
, vol.68
, pp. 3608
-
-
Guarin, F.J.1
Iyer, S.S.2
Powell, A.R.3
Ek, B.A.4
-
9
-
-
0342774109
-
-
M. F. Fyhn, J. Chevallier, and A. Nylandsted Larsen, J. Vac. Sci. Technol. B, 16, 1777 (1998).
-
(1998)
J. Vac. Sci. Technol. B
, vol.16
, pp. 1777
-
-
Fyhn, M.F.1
Chevallier, J.2
Nylandsted Larsen, A.3
-
11
-
-
0003459874
-
-
H. Ehrenreich, F. Seitz, and D. Turnbull (Academic, New York
-
G. A. Busch and R. Kern, in Solid State Physics, edited by H. Ehrenreich, F. Seitz, and D. Turnbull (Academic, New York, 1961), Vol. 11, p. 1.
-
(1961)
Solid State Physics
, vol.11
, pp. 1
-
-
Busch, G.A.1
Kern, R.2
-
12
-
-
0022807030
-
-
G. L. Allen, R. A. Bayles, W. W. Gile, and W. A. Jesser, Thin Solid Films, 144, 297 (1986).
-
(1986)
Thin Solid Films
, vol.144
, pp. 297
-
-
Allen, G.L.1
Bayles, R.A.2
Gile, W.W.3
Jesser, W.A.4
-
13
-
-
0348005838
-
-
S. L. Lai, J. Y. Guo, V. Petrova, G. Ramanath, and L. H. Allen, Phys. Rev. Lett., 77, 99 (1996).
-
(1996)
Phys. Rev. Lett.
, vol.77
, pp. 99
-
-
Lai, S.L.1
Guo, J.Y.2
Petrova, V.3
Ramanath, G.4
Allen, L.H.5
-
16
-
-
0346715714
-
-
M. T. Asom, A. R. Kortan, L. C. Kimerling, and R. C. Farrow, Appl. Phys. Lett., 55, 1439 (1989).
-
(1989)
Appl. Phys. Lett.
, vol.55
, pp. 1439
-
-
Asom, M.T.1
Kortan, A.R.2
Kimerling, L.C.3
Farrow, R.C.4
-
17
-
-
0022027690
-
-
M. Vergnat, M. Piecuch, G. Marchal, and M. Gerl, Philos. Mag. B, 51, 327 (1985).
-
(1985)
Philos. Mag. B
, vol.51
, pp. 327
-
-
Vergnat, M.1
Piecuch, M.2
Marchal, G.3
Gerl, M.4
-
18
-
-
0343891226
-
-
L. K. Nanver, G. Weyer, and B. I. Deutch, Phys. Status Solidi A, 61, K29 (1980).
-
(1980)
Phys. Status Solidi A
, vol.61
, pp. K29
-
-
Nanver, L.K.1
Weyer, G.2
Deutch, B.I.3
-
19
-
-
0022792525
-
-
E. M. Sherer, J. P. de Souza, C. M. Hasenack, I. J. R. Baumvol, Semicond. Sci. Technol., 1, 241 (1986).
-
(1986)
Semicond. Sci. Technol.
, vol.1
, pp. 241
-
-
Sherer, E.M.1
De Souza, J.P.2
Hasenack, C.M.3
Baumvol, I.J.R.4
-
20
-
-
85038988900
-
-
D. J. Wolford, J. Bernholc, and E. E. Haller, MRS Symposia Proceedings No. 163, Materials Research Society, Pittsburgh
-
P. Kringhøj, A. Nylandsted Larsen, and J. W. Petersen, in Impurities Defects and Diffusion in Semiconductors: Bulk and Layered Structures, edited by D. J. Wolford, J. Bernholc, and E. E. Haller, MRS Symposia Proceedings No. 163 (Materials Research Society, Pittsburgh, 1990), p. 585.
-
(1990)
Impurities Defects and Diffusion in Semiconductors: Bulk and Layered Structures
, pp. 585
-
-
Kringhøj, P.1
Nylandsted Larsen, A.2
Petersen, J.W.3
-
21
-
-
11644250587
-
-
A. Nylandsted Larsen, J. L. Hansen, R. S. Jensen, S. Y. Shiryaev, P. R. Østergaard, J. Hartung, G. Davies, F. Jensen, and J. W. Petersen, Phys. Scr., T54, 208 (1994).
-
(1994)
Phys. Scr.
, vol.T54
, pp. 208
-
-
Nylandsted Larsen, A.1
Hansen, J.L.2
Jensen, R.S.3
Shiryaev, S.Y.4
Østergaard, P.R.5
Hartung, J.6
Davies, G.7
Jensen, F.8
Petersen, J.W.9
-
23
-
-
0000642546
-
-
W. Drube, H. Schultes-Schrepping, H. G. Schmidt, R. Treusch, and G. Materlik, Rev. Sci. Instrum., 66, 1668 (1995).
-
(1995)
Rev. Sci. Instrum.
, vol.66
, pp. 1668
-
-
Drube, W.1
Schultes-Schrepping, H.2
Schmidt, H.G.3
Treusch, R.4
Materlik, G.5
-
27
-
-
0000163037
-
-
D. J. Eaglesham, A. E. White, L. C. Feldman, N. Moriya, and D. C. Jacobson, Phys. Rev. Lett., 70, 1643 (1993).
-
(1993)
Phys. Rev. Lett.
, vol.70
, pp. 1643
-
-
Eaglesham, D.J.1
White, A.E.2
Feldman, L.C.3
Moriya, N.4
Jacobson, D.C.5
-
30
-
-
84956079738
-
-
Y. Lereah, G. Deutscher, and R. Kofman, Europhys. Lett., 8, 53 (1989).
-
(1989)
Europhys. Lett.
, vol.8
, pp. 53
-
-
Lereah, Y.1
Deutscher, G.2
Kofman, R.3
-
34
-
-
85038995779
-
-
Plenum, New York
-
See, e.g., D. B. Williams and C. Barry Carter, Transmission Electron Microscopy (Plenum, New York, 1996), Vol II, p. 203.
-
(1996)
Transmission Electron Microscopy
, vol.2
, pp. 203
-
-
See, E.G.1
Williams, D.B.2
Barry Carter, C.3
-
35
-
-
0021439261
-
-
F. Vnuk, A. De Monte, and R. W. Smith, J. Appl. Phys., 55, 4171 (1984).
-
(1984)
J. Appl. Phys.
, vol.55
, pp. 4171
-
-
Vnuk, F.1
De Monte, A.2
Smith, R.W.3
|