Relaxation of strained, epitaxial Si1-xSnx

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 16, Issue 4, 1998, Pages 1777-1785

  Fyhn, M F ^a   Chevallier, J ^a   Nylandsted Larsen, A ^a  

^a AARHUS UNIVERSITY   (Denmark)

Author keywords

[No Author keywords available]

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EID: 0342774109     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (27)

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