Sum-frequency spectroscopy in total internal reflection geometry: Signal enhancement and access to molecular properties

Journal of the Optical Society of America B: Optical Physics

Volumn 14, Issue 10, 1997, Pages 2505-2512

  Lobau J ^a   Wolfrum, K ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4243595645     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.14.002505     Document Type: Article

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