Adsorption of alkyl-trichlorosilanes on glass and silicon: A comparative study using sum-frequency spectroscopy and XPS

Thin Solid Films

Volumn 289, Issue 1-2, 1996, Pages 272-281

  Lobau J ^a   Rumphorst, A ^b   Galla, K ^b   Seeger, S ^b   Wolfrum, K ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^b UNIVERSITY OF HEIDELBERG   (Germany)

Author keywords

Chemisorption; Infrared spectroscopy; Surface phonons and adsorbate vibrations; X ray photoelectron spectroscopy

Indexed keywords

ADSORPTION; CHEMICAL ACTIVATION; CLEANING; CONFORMATIONS; GLASS; INFRARED SPECTROSCOPY; MOLECULAR ORIENTATION; MOLECULAR VIBRATIONS; PHONONS; SILANES; SURFACE TREATMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

OCTADECYLTRICHLOROSILANE; PROPYLTRICHLOROSILANE; SUM FREQUENCY SPECTROSCOPY;

THIN FILMS;

EID: 0030291114     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)08925-0     Document Type: Article

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