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Volumn 184-185, Issue , 1998, Pages 199-202

Measurements of transient photocapacitance and photocurrent on MOVPE-grown Au/ZnSe/GaAs heterostructures

Author keywords

Deep levels; Interface states; Photocapacitance; Photocurrent; ZnSe

Indexed keywords


EID: 4243578129     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(98)80321-7     Document Type: Article
Times cited : (2)

References (5)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.