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Volumn 184-185, Issue , 1998, Pages 199-202
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Measurements of transient photocapacitance and photocurrent on MOVPE-grown Au/ZnSe/GaAs heterostructures
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Author keywords
Deep levels; Interface states; Photocapacitance; Photocurrent; ZnSe
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Indexed keywords
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EID: 4243578129
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(98)80321-7 Document Type: Article |
Times cited : (2)
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References (5)
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