Ultraviolet photoelectron spectroscopy of thin films of new materials for multilayer organic light emitting diodes

Surface Science

Volumn 482-485, Issue PART 2, 2001, Pages 1205-1209

  Casu, M B ^a   Imperia, P ^a   Schrader, S ^a   Falk, B ^b  

^a UNIVERSITY OF POTSDAM   (Germany)

^b Institute of Thin Film Technology and Microsensorics   (Germany)

Author keywords

Near edge extended X ray absorption fine structure (NEXAFS); Semi empirical models and model calculations; Synchrotron radiation photoelectron spectroscopy

Indexed keywords

EID: 4243511781     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)00733-6     Document Type: Article

References (8)

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