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Volumn 133, Issue 1-4, 2000, Pages 51-58

Basics, possibilities and limitations of the microscopic x-ray fluorescence analysis

Author keywords

Intensity mapping; Meteorite; Microscopic X ray fluorescence analysis; Stromatolith

Indexed keywords


EID: 4243336956     PISSN: 00263672     EISSN: None     Source Type: Journal    
DOI: 10.1007/s006040070071     Document Type: Article
Times cited : (6)

References (7)
  • 7
    • 24944499184 scopus 로고    scopus 로고
    • private communication
    • Klaus Stoewe, private communication.
    • Stoewe, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.