Linewidths in a semiconductor microcavity with variable strength of normal-mode coupling

Physical Review B - Condensed Matter and Materials Physics

Volumn 59, Issue 21, 1999, Pages 13525-13527

  Karaiskaj, D ^a   Maxisch, T ^a   Ellmers, C ^a   Kolbe, H J ^a   Weiser, G ^a   Rettig, R ^a   Leu, S ^a   Stolz, W ^a   Hofmann, M ^a   Jahnke, F ^a   Koch, S W ^a   Ruhle W W ^a  

^a PHILIPPS UNIVERSITY MARBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4243282401     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.13525     Document Type: Article

References (11)

1. K. Iga, F. Koyama, and S. Kinoshita, IEEE J. Quantum Electron.24, 1845 (1988).
2. C. Weisbuch, M. Nishioka, A. Ishikawa, and Y. Arakawa, Phys. Rev. Lett.69, 3314 (1992).
3. Y. Zhu, D J. Gauthier, S E. Morin, Q. Wu, H J. Carmichael, and T W. Mossberg, Phys. Rev. Lett.64, 2499 (1990).
4. F. Jahnke, M. Kira, S W. Koch, G. Khitrova, E K. Lindmark, T R. Nelson, Jr., D V. Wick, J D. Berger, O. Lyngnes, H M. Gibbs, and K. Tai, Phys. Rev. Lett.77, 5257 (1996).
5. A. Tredicucci, Y. Chen, V. Pellegrini, M. Börger, L. Sorba, F. Beltram, and F. Bassani, Phys. Rev. Lett.75, 3906 (1995).
6. D. Whittaker, P. Kinsler, T A. Fisher, M S. Skolnick, A. Armitage, A M. Afshar, M S. Sturge, J S. Roberts, G. Hill, and M A. Pate, Phys. Rev. Lett.77, 4792 (1996).
7. R. Houdre, R P. Stanley, U. Oesterle, M. Ilegems, and C. Weisbuch, Phys. Rev. B49, 16 761 (1994).
8. V. Savona, C. Piermarocchi, A. Quattropani, F. Tassone, and P. Schwendimann, Phys. Rev. Lett.78, 4470 (1997).
9. C. Ell, J. Prineas, T R. Nelson, Jr., S. Park, H M. Gibbs, G. Khitrova, and S W. Koch, Phys. Rev. Lett.80, 4795 (1998).
10. D. Whittaker, Phys. Rev. Lett.80, 4791 (1998).
11. C. Ellmers, S. Leu, R. Rettig, M. Hofmann, W W. Rühle, and W. Stolz, J. Cryst. Growth195, 630 (1998).