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Physical Review Letters

Volumn 80, Issue 21, 1998, Pages 4791-4794

What determines inhomogeneous linewidths in semiconductor microcavities?

(1) Whittaker, D M a

a TOSHIBA CORPORATION (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRON ABSORPTION; ELECTRON ENERGY LEVELS; ELECTRON SPECTROSCOPY; EXCITONS; GREEN'S FUNCTION; MAGNETIC FIELD EFFECTS; NUMERICAL ANALYSIS; PARTIAL DIFFERENTIAL EQUATIONS; PHOTONS; SEMICONDUCTOR QUANTUM WELLS;

POLARITON MULTIPLE SCATTERING; SEMICONDUCTOR MICROCAVITY;

ELECTRON SCATTERING;

EID: 11744328338 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.80.4791 Document Type: Article

Times cited : (87)

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