Observation of photoemission line widths narrower than the inverse lifetime

Physical Review Letters

Volumn 80, Issue 8, 1998, Pages 1766-1769

  Hansen, E D ^a   Miller, T ^a   Chiang, T C ^a  

^a United States of America   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4243273608     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.80.1766     Document Type: Article

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