Overlayer test of surface photoemission effect in Cu(100)

Physical Review Letters

Volumn 78, Issue 14, 1997, Pages 2807-2810

  Hansen, E D ^a   Miller, T ^a   Chiang, T C ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; BOUNDARY CONDITIONS; COPPER; MONOLAYERS; PERTURBATION TECHNIQUES; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; SILVER; SINGLE CRYSTALS; TESTING;

ANGLE RESOLVED PHOTOEMISSION; OVERLAYER TEST; PHOTON ENERGY;

SURFACES;

EID: 0031557578     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.78.2807     Document Type: Article

References (9)

1. S. Hüfner, Photoelectron Spectroscopy (Springer-Verlag, New York, 1995).
2. T. Miller, W. E. McMahon, and T.-C. Chiang, Phys. Rev. Lett., 77, 1167 (1996).
3. J. G. Tobin, S. W. Robey, and D. A. Shirley, Phys. Rev. B, 33, 2270 (1986).
4. J. G. Tobin, S. W. Robey, and L. E. Klebanoff, and D. A. Shirley, Phys. Rev. B, 35, 9056 (1987).
5. J. A. Knapp, F. J. Himpsel, and D. E. Eastman, Phys. Rev. B, 19, 4952 (1979).
6. N. V. Smith, P. Thiry, and Y. Petroff, Phys. Rev. B, 47, 15 476 (1993).
7. D. A. Shirley, Phys. Rev. B, 5, 4709 (1972).
8. E. D. Hansen, T. Miller, and T.-C. Chiang, Phys. Rev. (to be published).
9. A. Carlsson, D. Claesson, S.-Å. Lindgren, and L. Welldén, Phys. Rev. Lett., 77, 346 (1996), and references therein.