Overlayer test of surface photoemission effect in Cu(100)

Physical Review Letters

Volumn 78, Issue 14, 1997, Pages 2807-2810

  Hansen, E D ^a   Miller, T ^a   Chiang, T C ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; BOUNDARY CONDITIONS; COPPER; MONOLAYERS; PERTURBATION TECHNIQUES; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; SILVER; SINGLE CRYSTALS; TESTING;

ANGLE RESOLVED PHOTOEMISSION; OVERLAYER TEST; PHOTON ENERGY;

SURFACES;

EID: 0031557578     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.78.2807     Document Type: Article

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