Potentialities of photothermal displacement experiments in micro-scaled systems

Superlattices and Microstructures

Volumn 35, Issue 3-6, 2004, Pages 419-435

  Fotsing, J L Nzodoum ^a   Bein, B K ^a   Pelzl, J ^a  

^a RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

Effusivity; Hot spot localization; Pump probe beam offset; Thermal diffusivity; Thermal microscopy; Thin films

Indexed keywords

BESSEL FUNCTIONS; COMPUTER SIMULATION; MATHEMATICAL TECHNIQUES; MICROELECTRONICS; MICROMETERS; PARAMETER ESTIMATION; SIGNAL PROCESSING; THERMAL DIFFUSION; THIN FILMS; WAVE PROPAGATION;

EFFUSIVITY; HOT SPOT LOCALIZATION; PUMP-PROBE BEAM OFFSET; THERMAL DIFFUSIVITY; THERMAL MICROSCOPY;

PHASE MEASUREMENT;

EID: 4243179058     PISSN: 07496036     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.spmi.2003.09.015     Document Type: Conference Paper

References (8)

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