Microstructural analysis by scanning thermal microscopy of a nanocrystalline Fe surface induced by ultrasonic shot peening

Superlattices and Microstructures

Volumn 35, Issue 3-6, 2004, Pages 445-453

  Guo, F A ^a   Trannoy, N ^a   Lu, J ^b  

^a UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE   (France)

^b UNIVERSITÉ DE TECHNOLOGIE DE TROYES   (France)

Author keywords

Nanocrystalline material; Scanning thermal microscopy; Thermal conductivity; Ultrafine grained layer

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEFORMATION; GRAIN SIZE AND SHAPE; HEAT FLUX; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; OPTIMIZATION; POLYCRYSTALLINE MATERIALS; SHOT PEENING; THERMAL CONDUCTIVITY; TRANSMISSION ELECTRON MICROSCOPY; ULTRASONICS; X RAY DIFFRACTION ANALYSIS;

SCANNING PROBE MICROSCOPES (SPM); SCANNING THERMAL MICROSCOPY (STHM); SURFACE NANOCRYSTALLIZATION; ULTRAFINED-GRAINED LAYERS;

IRON;

EID: 4243179057     PISSN: 07496036     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.spmi.2003.12.004     Document Type: Conference Paper

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