Large firms and the science-technology interface: Patents, patent citations, and scientific output of multinational corporations in thin films

Scientometrics

Volumn 58, Issue 2, 2003, Pages 265-279

  Bhattacharya, Sujit ^a   Meyer, Martin ^b,c  

^a National Institute of Science Technology and Development Studies India   (India)

^b UNIVERSITY OF LEUVEN   (Belgium)

^c SYO Finnish Inst for Entpr Mgmt   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4243143940     PISSN: 01389130     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1026284510104     Document Type: Article

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