Generation and measurement of subnanosecond electron beams in gas-filled diodes

Instruments and Experimental Techniques

Volumn 51, Issue 2, 2008, Pages 213-219

  Tarasenko, V F ^a   Rybka, D V ^a   Baksht, E Kh ^a   Kostyrya, I D ^a   Lomaev, M I ^a  

^a INSTITUTE OF HIGH CURRENT ELECTRONICS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM FOIL; AVALANCHE DIODES; ELECTRIC CURRENTS; ELECTRONS;

SUPERSHORT AVALANCHE ELECTRON BEAMS (SAEB);

DIODES;

EID: 42349088132     PISSN: 00204412     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10786-008-2010-8     Document Type: Article

References (30)

1. Tarasova, L.V., Khudyakova, L.N., Loiko, T.V., and Tsukerman, V.A., Zh. Tekh. Fiz., 1974, vol. 44, no. 3, p. 564 [Sov. Phys. Tech. Phys. (egl. Transl.), vol. 19, no. 3, p. 351].
2. Babich, L.P., Loiko, T.V., and Tsukerman, V.A., Usp. Fiz. Nauk, 1990, vol. 160, no. 7, p. 49 [Sov. Phys. Usp. (Engl. Transl.), vol. 33, no. 7, p. 521].
3. Alekseev, S.B., Gubanov, V.P., Orlovskii, V.M., et al., Prib. Tekh. Eksp., 2003, no. 4, p. 81
4. [Instrum. Exp. Tech. (Engl. Transl.), no. 4, p. 505].
5. Tarasenko, V.F., Orlovskii, V.M., and Shunailov, S.A., Izv. Vyssh. Uchebn. Zaved., Fiz., 2003, vol. 46, no. 3, p. 94.
6. Tarasenko, V.F., Alekseev, S.B., Orlovskii, V.M., et al., Zh. Tekh. Fiz., 2004, vol. 74, no. 8, p. 30 [Tech. Phys. (Engl. Transl.), vol. 49, no. 8, p. 982].
7. Tarasenko, V.F. and Yakovlenko, S.I., Usp. Fiz. Nauk, 2004, vol. 174, no. 9, p. 953 [Phys.-Usp. (Engl. Transl.), vol. 47, no. 9, p. 887].
8. Tarasenko, V.F. and Yakovlenko, S.I., Plasma Devices Op., 2005, vol. 13, no. 4, p. 231.
9. Tarasenko, V.F., Shpak, V.G., Shunailov, S.A., and Kostyrya, I.D., Laser Part. Beams, 2005, vol. 23, no. 4, p. 545.
10. Tarasenko, V.F. and Kostyrya, I.D., Izv. Vyssh. Uchebn. Zaved., Fiz., 2005, vol. 48, no. 12, p. 40.
11. Mesyats, G.A., Korovin, S.D., Sharypov, K.A., et al., Pis'ma Zh. Tekh. Fiz., 2006, vol. 32, no. 1, p. 35 [Tech. Phys. Lett. (Engl. Transl.), vol. 32, no. 1, p. 18].
12. Tarasenko, V.F., Appl. Phys. Lett., 2006, vol. 88, no. 8, p. 1501.
13. Baksht, E.Kh., Rybka, D.V., Lomaev, M.I., and Tarasenko, V.F., Pis'ma Zh. Tekh. Fiz., 2006, vol. 32, no. 21, p. 69 [Tech. Phys. Lett. (Engl. Transl.), vol. 32, no. 11, p. 948].
14. Tarasenko, V.F., Kostyrya, I.D., Petin, V.K., and Shlyakhtun, S.V., Zh. Tekh. Fiz., 2006, vol. 76, no. 12, p. 37 [Tech. Phys. (Engl. Transl.), vol. 51, no. 12, p. 1576].
15. Mesyats, G.A., Pis'ma Zh. Éksp. Teor. Fiz., 2007, vol. 85, no. 2, p. 119 [JETP Lett. (Engl. Transl.), vol. 85, no. 2, p. 109].
16. Baksht, E.Kh., Rybka, D.V., Lomaev, M.I., and Tarasenko, V.F., Pis'ma Zh. Tekh. Fiz., 2007, vol. 33, no. 5, p. 71 [Tech. Phys. Lett. (Engl. Transl.), vol. 33, no. 3, p. 216].
17. Shpak, V.G., Prib. Tekh. Eksp., 1980, no. 3, p. 165.
18. Zheltov, K.A., Pikosekundnye sil'notochnye elektronnye uskoriteli (Picosecond High-Current Electron Accelerators), Moscow: Energoatomizdat, 1991.
19. Zagulov, F.Ya., Kotov, A.S., Shpak, V.G., et al., Prib. Tekh. Eksp., 1989, no. 2, p. 146.
20. Baksht, E.Kh., Balzovskii, E.V., Klimov, A.I., et al., Prib. Tekh. Eksp., 2007, no. 6, p. 100
21. [Instrum. Exp. Tech. (Engl. Transl.), no. 16, p. 10].
22. Aizenshtat, G.I., Baksht, E.Kh., Kostyrya, I.D., et al., Prib. Tekh. Eksp., 2007, no. 5, p. 125
23. [Instrum. Exp. Tech. (Engl. Transl.), no. 5, p. 695].
24. Afanas'ev, V.N., Bychkov, V.B., Lartsev, V.D., et al., Prib. Tekh. Eksp., 2005, no. 5, p. 88
25. Instrum. Exp. Tech. (Engl. Transl.), no. 5, p. 541].
26. Baigarin, K.A., Zinchenko, V.F., Likholat, V.M., and Timofeev, V.V., At. Energ., 1991, vol. 70, no. 6, p. 410.
27. Tarasenko, V.F., Skakun, V.S., Kostyrya, I.D., et al., Laser Part. Beams, 2004, vol. 22, no. 1, p. 75.
28. Maltsev, A.N., IEEE Trans. Plasma Sci., 2006, vol. 34, no. 4, p. 1166.
29. Andreev, Yu.A., Kostyrya, I.D., Koshelev, V.I., and Tarasenko, V.F., Zh. Tekh. Fiz., 2006, vol. 76, no. 5, p. 105 [Tech. Phys. (Engl. Transl.), vol. 76, no. 5, p. 637].
30. Kostyrya, I.D. and Tarasenko, V.F., Zh. Tekh. Fiz., 2006, vol. 76, no. 11, p. 118 [Tech. Phys. (Engl. Transl.), vol. 51, no. 11, p. 1512].