Microstructure dependence of deuterium retention and blistering in the near-surface region of tungsten exposed to high flux deuterium plasmas of 38 eV at 315 K

Physica Scripta T

Volumn T128, Issue , 2007, Pages 96-99

  Shu, W M ^a   Kawasuso, A ^a   Miwa, Y ^a   Wakai, E ^a   Luo, G N ^a,b   Yamanishi, T ^a  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

^b INSTITUTE OF PLASMA PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; ELECTRON DIFFRACTION; POSITRON ANNIHILATION; RECRYSTALLIZATION (METALLURGY); SINGLE CRYSTALS; TUNGSTEN COMPOUNDS;

BLISTERING; DEUTERIUM RETENTION; MICROSTRUCTURE DEPENDENCE; PLASMA EXPOSURE;

DEUTERIUM COMPOUNDS;

EID: 42249097728     PISSN: 02811847     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1088/0031-8949/2007/T128/019     Document Type: Conference Paper

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