Effects of background gas impurities during D+ irradiation on D trapping in single crystal tungsten

Journal of Nuclear Materials

Volumn 337-339, Issue 1-3 SPEC. ISS., 2005, Pages 629-633

  Poon, M ^a   MacAulay Newcombe, R G ^a   Davis, J W ^a   Haasz, A A ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

H0400; I0400; Ion surface interactions; R0100; Retention; Surface analysis; T1000; Thermal desorption; Tungsten

Indexed keywords

ANNEALING; DESORPTION; IMPURITIES; ION BOMBARDMENT; MICROSCOPIC EXAMINATION; PARTIAL PRESSURE; TUNGSTEN;

ION-SURFACE INTERACTIONS; RETENTION; SURFACE ANALYSIS; THERMAL DESORPTION;

SINGLE CRYSTALS;

EID: 13844315995     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnucmat.2004.09.042     Document Type: Conference Paper

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