Diamonds for X-ray optical applications at 3rd and 4 th generation X-ray sources

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6705, Issue , 2007, Pages

  Burns, R C ^a   Chumakov, A ^b   Carbone, G ^b   Connell, S H ^c   Dube, D ^c   Godfried, H P ^d   Hansen, J O ^a   Hartwig J ^b   Masiello, F ^b   Rebak, M ^c   Rommeveaux, A ^b   Setshedi, R ^c   Van Vaerenbergh, P ^b   Gibaud, A ^e  

^a Element Six Pty Ltd South Africa   (South Africa)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c UNIVERSITY OF THE WITWATERSRAND   (South Africa)

^d Element Six BV   (Netherlands)

^e UNIVERSITÉ DU MAINE   (France)

Author keywords

Coherence; GID; GISAXS; Low strain diamond; X ray characterisation; X ray topography

Indexed keywords

DIAMONDS; OPTICAL DEVICES; SINGLE CRYSTALS; STRAIN; SYNCHROTRONS; X RAY DIFFRACTION; X RAY SCATTERING;

LOW STRAIN DIAMONDS; X-RAY CHARACTERIZATION; X-RAY SOURCES;

X RAY OPTICS;

EID: 42149173378     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.736698     Document Type: Conference Paper

References (1)

1. D Altin, J Härtwig, R Köhler, W Ludwig, M Ohler and H Klein, Journal of Synchrotron Radiation 9, 282-286 (2002)