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Volumn 6730, Issue , 2007, Pages
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Development of mask-DFM system "MiLE" load estimation of mask manufacturing
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Author keywords
DFM; Manufacturability; MiLE; MRC; Shot; Workload estimation
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Indexed keywords
DESIGN FOR MANUFACTURING (DFM);
MANUFACTURABILITY;
MASK RULE CHECKING (MRC);
PHOTOMASK MANUFACTURING;
WORKLOAD ESTIMATION;
DEFECTS;
INSPECTION;
PRODUCT DESIGN;
SEMICONDUCTOR DEVICE MANUFACTURE;
THREE DIMENSIONAL;
WSI CIRCUITS;
MASKS;
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EID: 42149117136
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.746577 Document Type: Conference Paper |
Times cited : (2)
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References (7)
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