Temperature- and field-dependence of critical currents in NbN microbridges

Journal of Physics: Conference Series

Volumn 97, Issue 1, 2008, Pages

  Engel, A ^a   Bartolf, H ^a   Schilling, A ^a   Il'in, K ^b   Siegel, M ^b   Semenov, A ^c   Hubers H W ^c  

^a PHYSIK INSTITUT DER UNIVERSITÄT ZÜRICH   (Switzerland)

^b UNIVERSITY OF KARLSRUHE   (Germany)

^c GERMAN AEROSPACE CENTER DLR   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 42149116898     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/97/1/012152     Document Type: Article

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