Current-induced critical state in NbN thin-film structures

Journal of Low Temperature Physics

Volumn 151, Issue 1-2 PART 1, 2008, Pages 585-590

  Il'in, K ^a   Siegel, M ^a   Engel, A ^b   Bartolf, H ^b   Schilling, A ^b   Semenov, A ^c   Huebers, H W ^c  

^a UNIVERSITY OF KARLSRUHE   (Germany)

^b PHYSIK INSTITUT DER UNIVERSITÄT ZÜRICH   (Switzerland)

^c GERMAN AEROSPACE CENTER DLR   (Germany)

Author keywords

Critical current; Edge barrier; Magnetic vortex; Niobium nitride; Thin superconducting films

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRITICAL CURRENTS; MICROMETERS; PENETRATION DEPTH (SUPERCONDUCTIVITY);

EDGE BARRIER; MAGNETIC VORTEX; NIOBIUM NITRIDE;

SUPERCONDUCTING FILMS;

EID: 40649115204     PISSN: 00222291     EISSN: 15737357     Source Type: Journal    
DOI: 10.1007/s10909-007-9690-5     Document Type: Article

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