Design-for-six-sigma for multiple response systems

International Journal of Product Development

Volumn 5, Issue 1-2, 2008, Pages 39-53

  Savage, Gordon J ^a   Son, Young Kap ^a  

^a UNIVERSITY OF WATERLOO   (Canada)

Author keywords

Costs; Defect rate; Mean and tolerance design; Multiple responses; Probability; Six Sigma

Indexed keywords

EID: 42049123443     PISSN: 14779056     EISSN: 17418178     Source Type: Journal    
DOI: 10.1504/IJPD.2008.016369     Document Type: Article

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