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Volumn 20, Issue 11, 2008, Pages
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The signature of subsurface Kondo impurities in the local tunnel current
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC CURRENTS;
IMPURITIES;
KONDO EFFECT;
SCANNING TUNNELING MICROSCOPY;
LOCAL TUNNEL CURRENT;
SUBSURFACE KONDO IMPURITIES;
TUNNEL POINT CONTACT;
ELECTRON TUNNELING;
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EID: 41849144868
PISSN: 09538984
EISSN: 1361648X
Source Type: Journal
DOI: 10.1088/0953-8984/20/11/115208 Document Type: Article |
Times cited : (12)
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References (26)
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