Method to determine defect positions below a metal surface by STM

Physical Review B - Condensed Matter and Materials Physics

Volumn 71, Issue 11, 2005, Pages

  Avotina, Ye S ^a,b   Kolesnichenko, Yu A ^a   Omelyanchouk, A N ^a   Otte, A F ^b   Van Ruitenbeek, J M ^b  

^a B VERKIN INSTITUTE FOR LOW TEMPERATURE PHYSICS AND ENGINEERING   (Ukraine)

^b LEIDEN UNIVERSITY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

METAL;

ARTICLE; CONDUCTANCE; ELECTRIC POTENTIAL; ELECTRON; MOLECULAR INTERACTION; MOLECULAR PHYSICS; OSCILLATION; SCANNING TUNNELING MICROSCOPY;

EID: 20044395342     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.71.115430     Document Type: Article

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