Mesurements of thin polymer films employing split post dielectric resonator technique

16th International Conference on Microwaves, Radar and Wireless Communications, MIKON 2006

Volumn , Issue , 2006, Pages 229-231

  Jacob, Mohan ^a   Krupka, Jerzy ^b   Derzakowski, Krzysztof ^b   Mazierska, Janina ^c  

^a JAMES COOK UNIVERSITY   (Australia)

^b WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

^c MASSEY UNIVERSITY   (New Zealand)

Author keywords

Dielectric properties; Thin polymer films

Indexed keywords

DIELECTRIC LOSSES; DIELECTRIC RESONATORS; THIN FILMS; UNCERTAINTY ANALYSIS;

SPLIT POST DIELECTRIC RESONATOR (SPDR); THIN POLYMER FILMS;

POLYMER FILMS;

EID: 41849131516     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MIKON.2006.4345156     Document Type: Conference Paper

References (3)

1. J. Krupka, R.G Geyer, J. Baker-Jarvis and J. Ceremuga, "Measurements of the complex permittivity of microwave circuit board substrates using split dielectric resonator and reentrant cavity techniques", DMMA'96 Conference Proc., pp.21-24, Bath, U.K. September 23-26, 1996.
2. J. Krupka, A.P. Gregory, O.C. Rochard, R.N. Clarke B. Riddle, and J. Baker-Jarvis, "Uncertainty of Complex Permittivity Measurements by Split-Post Dielectric Resonator Technique", Journal of the European Ceramic Society, vol. 21, pp.2673-2676, 2001
3. J. Krupka, Wei-Te Huang, and Mean-Jue Tung, "Complex Permittivity Measurements of Thin Ferroelectric Films Employing Split Post Dielectric Resonator", Oral presentation at IMF11 Conference, Iguacu, Brasil September 5-9, 2005