A study on the structural-microstructural characterisation and defect structure of Ru based magnetosuperconductor, RuSr2Eu1.6Ce0.4Cu2O10-δ

Physica C: Superconductivity and its Applications

Volumn 468, Issue 6, 2008, Pages 458-463

  Asthana, Anjana ^a   Matsui, Yoshio ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

61.72. y; 61.72.Nn; Defect; Magneto superconductor; Microstructure

Indexed keywords

ELECTRON DIFFRACTION; HIGH RESOLUTION ELECTRON MICROSCOPY; MAGNETOELECTRIC EFFECTS; MICROSTRUCTURE; SUPERCONDUCTING MATERIALS;

DEFECT STRUCTURE; MAGNETOSUPERCONDUCTORS;

RUTHENIUM COMPOUNDS;

EID: 41849110902     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physc.2008.01.010     Document Type: Article

References (19)

1. Eibl O. Microscopy. Res. Tech. 30 (1995) 218
2. Grebille D., Lepoittevin C., Malo S., Perez O., Nguyen N., and Hervieu M. J. Solid St. Chem. 179 (2006) 3849
3. Kamimura O., Kasai H., Akashi T., Matsuda T., Harada K., Masuko J., Yoshida T., Osakabe N., Tonomura A., Beleggia M., Pozzi G., Shimoyama J., Kishio K., Hanaguri T., Kitazawa K., Sasase M., and Okayasu S. J. Phys. Soc. Jpn. 71 (2002) 1840
4. Kishida K., and Browning N.D. Physica C 351 (2001) 281
5. Sasase M., Okayasu S., Kurata H., and Hojou K. J. Elec. Microscopy 51 (2002) S235
6. Lebedev O.I., Van Tendeloo G., Attfield J.P., and Mclaughlin A.C. Phys. Rev. B 73 (2006) 224524
7. Bauenfeind L., Widder W., and Braun H.F. Physica C 254 (1995) 151
8. Felner I., Asaf U., Levi Y., and Millo O. Phys. Rev. B 55 (1997) R3374
9. Felner I., and Asaf U. Int. J. Mod. Phys. B 12 (1988) 3220
10. Tokunaga Y., Kotegawa H., Ishida K., Kitaoka Y., Takigiwa H., and Akimitsu J. Phys. Rev. lett. 86 (2001) 5767
11. Bernhard C., Tallon J.L., Niedermayer Ch., Blasius Th., Golnik A., Brucher E., Kremer R.K., Noakes D.R., Stronach C.E., and Ansaldo E.J. Phys. Rev. B 59 (1999) 14099
12. Sakai N., Maeda T., Yamauchi H., and Tanaka S. Physica C 212 (1993) 75
13. Knee C.S., Reinford B.D., and Weller M.T. J. Mater. Chem. 10 (2000) 2445
14. Chmaissem O., Jorgensen J.D., Shaked H., Dollar P., and Tallon J.L. Phys. Rev. B 61 (2000) 6401
15. McLaughlin A.C., Zhou W., Attfield J.P., Fitch A.N., and Tallon J.L. Phys. Rev. B 60 (1999) 7512
16. Awana V.P.S., Ichihara S., Karppinen M., and Yamauchi H. Physica C 378 (2002) 249
17. Yokosawa T., Awana V.P.S., Kimoto K., Takayama-Muromachi E., Karpinnen M., Yamauchi H., and Matsui Y. Ultramicroscopy 98 (2004) 283
18. Matsui Y., Horiuchi S., Sawa H., Obara K., and Akimitsu J. Jpn. J. Appl. Phys. 28 (1989) L1555
19. Van Tendeloo G., Chaillout C., Capponi J.J., Marezio M., and Antipov E.V. Physica C 223 (1994) 219