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Volumn 1, Issue , 2006, Pages 996-999

High efficiency rear emitter pert cells on CZ and FZ n-type silicon substrates

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER LIFETIME; CONVERSION EFFICIENCY; GRAIN BOUNDARIES; OPEN CIRCUIT VOLTAGE; PASSIVATION; SUBSTRATES;

EID: 41749092034     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/WCPEC.2006.279286     Document Type: Conference Paper
Times cited : (24)

References (5)
  • 1
    • 25144483294 scopus 로고    scopus 로고
    • Manufacture of solar cells with 21% efficiency
    • Paris
    • W.P. Mulligan, et al, "Manufacture of solar cells with 21% efficiency", 19th European PVSEC, Paris, 2004, pp. 387.
    • (2004) 19th European PVSEC , pp. 387
    • Mulligan, W.P.1
  • 3
  • 4
    • 0031370370 scopus 로고    scopus 로고
    • Investigation of Carrier Lifetime Instabilities in CZ-Grown silicon
    • J. Schmidt, A.G. Aberle and R. Hezel, "Investigation of Carrier Lifetime Instabilities in CZ-Grown silicon", 26th IEEE PVSC, 1997, pp. 13-18.
    • (1997) 26th IEEE PVSC , pp. 13-18
    • Schmidt, J.1    Aberle, A.G.2    Hezel, R.3
  • 5
    • 0033364929 scopus 로고    scopus 로고
    • 24.5% Efficiency Silicon PERT Cells on MCZ Substrates and 24.7% Efficiency PERL Cells on FZ Substrates
    • J. Zhao, A. Wang and M.A. Green, "24.5% Efficiency Silicon PERT Cells on MCZ Substrates and 24.7% Efficiency PERL Cells on FZ Substrates", Progress in Photovoltaics, 7, 1999, pp. 471-474.
    • (1999) Progress in Photovoltaics , vol.7 , pp. 471-474
    • Zhao, J.1    Wang, A.2    Green, M.A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.