Fully functional "real time" non-linear device characterization system incorporating active load control

Proceedings of the 36th European Microwave Conference, EuMC 2006

Volumn , Issue , 2006, Pages 1610-1613

  Williams, Tudor ^a   Benedikt, Johannes ^a   Tasker, Paul J ^a  

^a CARDIFF UNIVERSITY   (United Kingdom)

Author keywords

Device characterization; Load pull; Power amplifiers

Indexed keywords

COST EFFECTIVENESS; DATA STRUCTURES; ELECTRIC LOADS; POWER AMPLIFIERS; WAVEFORM ANALYSIS;

DEVICE CHARACTERIZATION; SIGNAL CHARACTERIZATION SYSTEMS;

SIGNAL ANALYSIS;

EID: 41649120224     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EUMC.2006.281408     Document Type: Conference Paper

References (6)

1. D.J. Williams, P.J. Tasker, "An Automated Active Source and Load Pull Measurement System", Proceedings of the 6th IEEE High Frequency Postgraduate Colloquium, Cardiff, September 9th-10th 2001, pp 7-12.
2. P.D. Bradley, R.S. Tucker "Computer-Corrected Loadpull characterization of Power MESFET's" IEEE MTT-S international Microwave Symposium Digest 1983, pp 224-226.
3. B. Hughes, A. Ferrero, A. Cognata, "Accurate on-wafer power and harmonic measurements of MM-wave amplifiers and devices", IEEE MTT-S international Microwave Symposium Digest 1-5 June 1992, pp 1019-1022.
4. D. Barataud, F. Blache, A. Mallet, P.P Bouysse, J.M Nebus, J.P Villotte, J. Obregon, J. Verspecht, P. Auxemery, " Measurement and control of Current/Voltage waveforms of microwave transistors using a harmonic load-pull system for the optimum design of high efficiency power amplifiers", IEEE Transactions on Instrumentation and measurement, Volume 48, Issue 4, August 1999, PP 835-842.
5. T. Williams, J. Benedikt and P.J Tasker, "Experimental Evaluation of an Active Envelope Load Pull Architecture for High Speed Device Characterization", IEEE MTT-S international Microwave Symposium Digest 12-17 June 2005, pp 1509-1512.
6. T. Williams, J. Benedikt and P.J Tasker, "Application of a Novel Envelope Load-Pull Architecture in Large Signal Device Characterization", EuMC Symposium Digest 2005.