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Volumn 2005, Issue , 2005, Pages 1509-1512
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Experimental evaluation of an active envelope load pull architecture for high speed device characterization
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Author keywords
Device Characterization; Load Pull; Power Amplifiers; Waveform measurements
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Indexed keywords
DEVICE CHARACTERIZATION;
ENVELOPE FREQUENCIES;
FEEDBACK LOOP;
LOAD PULL ARCHITECTURES;
AMPLITUDE MODULATION;
POWER AMPLIFIERS;
PRODUCT DESIGN;
WAVEFORM ANALYSIS;
TRANSISTORS;
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EID: 33749253556
PISSN: 0149645X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/MWSYM.2005.1516980 Document Type: Conference Paper |
Times cited : (27)
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References (7)
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