Measurement of broadband dielectric constant using substrate integrated waveguide

Proceedings of the 36th European Microwave Conference, EuMC 2006

Volumn , Issue , 2006, Pages 392-394

  Tseng, Chao Hsiung ^a   Chu, Tah Hsiung ^a  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

BROADBAND NETWORKS; LIGHT REFLECTION; MILLIMETER WAVE DEVICES; OPTICAL RESONATORS; PERMITTIVITY MEASUREMENT; SUBSTRATES;

RING RESONATORS; SUBSTRATE INTEGRATED WAVEGUIDE (SIW); SUBSTRATE SLABS;

OPTICAL WAVEGUIDES;

EID: 41649094576     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EUMC.2006.281356     Document Type: Conference Paper

References (10)

1. R. M. Redheffer, "The Measurement of dielectric constants," Technique of Microwave Measurements. New York: McGraw-Hill, 1947, Chapter 10, pp. 561-676.
2. M. N. Afsar, J. R. Birch, R. N. Clarke and G. W. Chantry, "The measurement of the properties of materials," Proc. IEEE, vol. 74. pp. 183-199. Jan. 1986.
3. W. B. Weir, "Automatic measurement of complex dielectric constant and permeability at microwave frequencies," Proc. IEEE, vol. 62, pp. 33-36, Jan. 1974.
4. G. Zou, H. Grönqvist, J. P. Starski, and J. Liu, "Characterization of liquid crystal polymer for high frequency system-in-a- package applications," IEEE Trans. Adv. Packag., vol. 25, pp. 503-508, Nov. 2002.
5. T. Itoh, "A new method for measuring properties of dielectric materials using mierostrip cavity," IEEE Trans. Microw. Theory Tech., vol. MTT-22, pp. 572-576, May 1974.
6. D. Shimin, "A new method for measuring dielectric constant using the resonant frequency of a patch antenna," IEEE Trans. Microw. Theory Tech., vol. MTT-34, pp. 923-931, Sep. 1986.
7. F. Xu and K. Wu, "Guided-wave and leakage characteristics of substrate integrated waveguide," IEEE Trans. Microw. Theory Tech., vol. 53, pp. 66-73, Jan. 2005.
8. M. D. Janezic and J. A. Jargon, "Complex permittivity determination from propagation constant measurements," IEEE Microw. Guided Wave Lett., vol. 9, pp. 76-78, Feb. 1999.
9. R. B. Marks, "A multiline method of network analyzer calibration," IEEE Trans. Microw. Theory Tech., vol. 39, pp. 1205-1215, Jul. 1991.
10. C. H. Tseng and T. H. Chu, "Measurement of frequency-dependent equivalent width of substrate integrated waveguide," IEEE Trans. Microw. Theory Tech., to be published.