Measurement of frequency-dependent equivalent width of substrate integrated waveguide

IEEE Transactions on Microwave Theory and Techniques

Volumn 54, Issue 4, 2006, Pages 1431-1437

  Tseng, Chao Hsiung ^a,b   Chu, Tah Hsiung ^a,c,d  

^a IEEE   (Taiwan)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^d University of California at Los Angeles ^*  (Taiwan)

Author keywords

Calibration; Dielectric measurements; Microwave measurement; Substrate integrated waveguides (SIWs)

Indexed keywords

DIELECTRIC MEASUREMENTS; RING RESONATOR; SUBSTRATE INTEGRATED WAVEGUIDES (SIWS);

CHARACTERIZATION; COMPUTATIONAL METHODS; FREQUENCY MODULATION; MICROWAVE MEASUREMENT; PERMITTIVITY; RESONATORS;

OPTICAL WAVEGUIDES;

EID: 33645938927     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2006.871245     Document Type: Article

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