Residual resistivity model and its application

IEEE International Integrated Reliability Workshop Final Report

Volumn , Issue , 2006, Pages 134-135

  Doyen, L ^a   Federspiel, X ^a   Ney, D ^b   Sers, G ^a   Girault, V ^b   Arnaud, L ^c   Wouters, Y ^d  

^a CRandD labs   (France)

^b STMICROELECTRONICS   (France)

^c CEA GRENOBLE   (France)

^d UNIV GRENOBLE ALPES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 41649088415     PISSN: 19308841     EISSN: 23748036     Source Type: Conference Proceeding    
DOI: 10.1109/IRWS.2006.305227     Document Type: Conference Paper

References (9)

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3. Steinhogl, W et al., Journal of Applied Physics, 2005 97(2):023706.
4. G. Steinlesberger et al, Microccectronic Engineering, 2002, 64(1-4):409-416.
5. JF Guillaumond, Thèse de Doctarat, INPG 2005
6. Solid stute Physics, C.Kittel,
7. X. Federspiel, IEEE IRW 2005
8. CCR handbook of Electrical Resistivities of binary Metallic Alloys
9. Schafft H., Suehle J., Solid Statae Electronics, vol35, No3, pp403-410, 1992.